The author is a 1952 graduate of Palisade High School. He attended the University of Colorado at Boulder where he received a B.S. EE degree. He also received a PhD from Stanford University. He was employed by IBM for 38 years, retiring in 1993 as an IBM Fellow. He holds 12 U.S. Patents and has presented numerous papers on the testing of electronic components. He is a co-author of the book, Built-in Test for VLSI. Since retirement, he has been pursuing genealogical research for his extended family.